Physical Principles of Electron Microscopy (Record no. 9771)

MARC details
000 -LEADER
fixed length control field 00751nam#a2200253ua#4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 180323 2006
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783319398761
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502.825
Item number Eg22P
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Egerton, R.F.
9 (RLIN) 10007
245 ## - TITLE STATEMENT
Title Physical Principles of Electron Microscopy
Remainder of title An introduction to TEM, SEM, and AEM
Statement of responsibility, etc. by R.R. Egerton
250 ## - EDITION STATEMENT
Edition statement 2nd Ed.
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Springer
Place of publication, distribution, etc. Berlin
Date of publication, distribution, etc. 2006.
300 ## - PHYSICAL DESCRIPTION
Extent xi, 196p.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electron Microscopy
9 (RLIN) 10008
Topical term or geographic name entry element Microscopy
9 (RLIN) 10009
Topical term or geographic name entry element Materials
9 (RLIN) 10010
Topical term or geographic name entry element Nanotechnology
9 (RLIN) 10011
Topical term or geographic name entry element Materials science
9 (RLIN) 10012
653 ## - INDEX TERM--UNCONTROLLED
Uncontrolled term Electron Microscopy
Uncontrolled term Microscopy
Uncontrolled term Materials
Uncontrolled term Nanotechnology
Uncontrolled term Materials science
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Shelving location Date acquired Total Checkouts Full call number Barcode Date last seen Price effective from Koha item type
        S. R. Ranganathan Learning Hub S. R. Ranganathan Learning Hub   2022-12-13   502.825 Eg22P 09942 2022-12-13 2022-12-13 Book