Normal view MARC view ISBD view

Physical Principles of Electron Microscopy An introduction to TEM, SEM, and AEM

Egerton, R.F.

Physical Principles of Electron Microscopy An introduction to TEM, SEM, and AEM by R.R. Egerton - 2nd Ed. - Berlin Springer 2006. - xi, 196p.

ISBN: 9783319398761

Subjects--Topical Terms:
Electron Microscopy
Microscopy
Materials
Nanotechnology
Materials science

Subjects--Index Terms: Electron Microscopy Microscopy Materials Nanotechnology Materials science

Dewey Class. No.: 502.825 / Eg22P

Print
Send to device
Save record
BIBTEX Dublin Core MARC (non-Unicode/MARC-8) MARCXML RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)