| 000 | 00911nam#a2200205ua#4500 | ||
|---|---|---|---|
| 008 | 050420s2006 njua b 001 0 eng | ||
| 020 | _a9780471739067 | ||
| 082 |
_a621.381 52 _bSc75S |
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| 100 |
_aSchroder, Dieter K. _98724 |
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| 245 |
_aSemiconductor Material and Device Characterization _cby Dieter K. Schroder. |
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| 250 | _a3rd ed. | ||
| 260 |
_bIEEE Press/ Wiley Interscience _aHoboken, N.J. _cc2006. |
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| 300 |
_axv, 779 p. _bill. _c25 cm. |
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| 504 | _aIncludes bibliographical references and index. | ||
| 650 |
_aSemiconductors. _98725 |
||
| 650 |
_aSemiconductors _xTesting. _98726 |
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| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html |
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html |
| 999 |
_c9426 _d9426 |
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