| 000 | 00745nam#a2200217ua#4500 | ||
|---|---|---|---|
| 008 | 150528 2007 | ||
| 020 | _a9788173197970 | ||
| 082 |
_a620.112 7 _bR137P |
||
| 100 |
_aRaj, Baldev _98475 |
||
| 245 |
_aPractical Non-Destructive Testing _cby Baldev Raj, T. Jayakumar, and M. Thavasimuthu |
||
| 250 | _a3rd | ||
| 260 |
_bNarosa Publishing House _aNew Delhi _c2007. |
||
| 300 | _axiv, 211p. | ||
| 650 |
_aFailure analysis _98476 |
||
| 650 |
_aNon-Destructive Testing _98477 |
||
| 653 | _aFailure analysis | ||
| 653 | _aNon-Destructive Testing | ||
| 700 |
_aJayakumar, T. _98478 |
||
| 700 |
_aThavasimuthu, M. _98479 |
||
| 856 |
_uhttp://www.narosa.com/books_display.asp?catgcode=978-81-7319-797-0 _yPublisher's Website |
||
| 999 |
_c9348 _d9348 |
||