000 04740nam a2200361Ia 4500
000 05638nam a22003855i 4500
001 978-3-031-25099-6
003 DE-He213
005 20240319120846.0
007 cr nn 008mamaa
008 230320s2023 sz | s |||| 0|eng d
020 _a9783031250996
_9978-3-031-25099-6
082 _a6.31
100 _aDomingues, João L. C. P.
_930782
245 _aSpeeding-Up Radio-Frequency Integrated Circuit Sizing with Neural Networks
_cby João L. C. P. Domingues, Pedro J. C. D. C. Vaz, António P. L. Gusmão, Nuno C. G. Horta, Nuno C. C. Lourenço, Ricardo M. F. Martins.
_h[electronic resource] /
250 _a1st ed. 2023.
260 _aCham
_bSpringer International Publishing
_c2023
300 _aVIII, 109 p. 70 illus., 59 illus. in color.
_bonline resource.
520 _aIn this book, innovative research using artificial neural networks (ANNs) is conducted to automate the sizing task of RF IC design, which is used in two different steps of the automatic design process. The advances in telecommunications, such as the 5th generation broadband or 5G for short, open doors to advances in areas such as health care, education, resource management, transportation, agriculture and many other areas. Consequently, there is high pressure in today's market for significant communication rates, extensive bandwidths and ultralow-power consumption. This is where radiofrequency (RF) integrated circuits (ICs) come in hand, playing a crucial role. This demand stresses out the problem which resides in the remarkable difficulty of RF IC design in deep nanometric integration technologies due to their high complexity and stringent performances. Given the economic pressure for high quality yet cheap electronics and challenging time-to-market constraints, there is an urgent need for electronic design automation (EDA) tools to increase the RF designers' productivity and improve the quality of resulting ICs. In the last years, the automatic sizing of RF IC blocks in deep nanometer technologies has moved toward process, voltage and temperature (PVT)-inclusive optimizations to ensure their robustness. Each sizing solution is exhaustively simulated in a set of PVT corners, thus pushing modern workstations' capabilities to their limits. Standard ANNs applications usually exploit the model's capability of describing a complex, harder to describe, relation between input and target data. For that purpose, ANNs are a mechanism to bypass the process of describing the complex underlying relations between data by feeding it a significant number of previously acquired input/output data pairs that the model attempts to copy. Here, and firstly, the ANNs disrupt from the most recent trials of replacing the simulator in the simulation-based sizing with a machine/deep learning model, by proposing two different ANNs, the first classifies the convergence of the circuit for nominal and PVT corners, and the second predicts the oscillating frequencies for each case. The convergence classifier (CCANN) and frequency guess predictor (FGPANN) are seamlessly integrated into the simulation-based sizing loop, accelerating the overall optimization process. Secondly, a PVT regressor that inputs the circuit's sizing and the nominal performances to estimate the PVT corner performances via multiple parallel artificial neural networks is proposed. Two control phases prevent the optimization process from being misled by inaccurate performance estimates. As such, this book details the optimal description of the input/output data relation that should be fulfilled. The developed description is mainly reflected in two of the system's characteristics, the shape of the input data and its incorporation in the sizing optimization loop. An optimal description of these components should be such that the model should produce output data that fulfills the desired relation for the given training data once fully trained. Additionally, the model should be capable of efficiently generalizing the acquired knowledge in newer examples, i.e., never-seen input circuit topologies.
650 _aComputational Science and Engineering.
_930783
650 _aMachine learning.
_930784
650 _aMachine Learning.
_930785
650 _aMathematical Models of Cognitive Processes and Neural Networks.
_930786
650 _aMathematics
_930787
650 _aNeural networks (Computer science) .
_930788
700 _aGusmão, António P. L.
_930789
700 _aHorta, Nuno C. G.
_930790
700 _aLourenço, Nuno C. C.
_930791
700 _aMartins, Ricardo M. F.
_930792
700 _aVaz, Pedro J. C. D. C.
_930793
856 _uhttps://doi.org/10.1007/978-3-031-25099-6
942 _cEBK
_2ddc
999 _c15159
_d15159