| 000 | 01253nmm a2200301 i 4500 | ||
|---|---|---|---|
| 005 | 20230705152730.0 | ||
| 008 | 220829s2023 gw a ob 001 0 eng d | ||
| 020 |
_a9783527829712 _q(electronic bk. : oBook) |
||
| 020 |
_a9783527829699 _q(electronic book) |
||
| 020 |
_a3527829695 _q(electronic book) |
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| 020 |
_a3527829717 _q(electronic book) |
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| 020 |
_z3527348042 _q(hardcover) |
||
| 020 |
_z9783527348046 _q(hardcover) |
||
| 024 | 7 |
_a10.1002/9783527829712 _2doi |
|
| 082 |
_a535/.4 _223/eng/20220916 |
||
| 100 |
_aShindÅ, D. _q(Daisuke), _d1953- _eauthor. _922416 |
||
| 245 |
_aMaterial characterization using electron holography / _cDaisuke Shindo, Takeshi Tomita. |
||
| 260 |
_aWeinheim, Germany : _bWiley-VCH, _c[2023] |
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| 300 | _a1 online resource | ||
| 504 | _aIncludes bibliographical references and index. | ||
| 590 | _bWiley Frontlist Obook All English 2022 | ||
| 650 |
_aElectron holography. _922417 |
||
| 650 |
_aTransmission electron microscopy. _922418 |
||
| 650 |
_aElectron holography. _2fast _0(OCoLC)fst00906675 _922417 |
||
| 650 |
_aTransmission electron microscopy. _2fast _0(OCoLC)fst01154860 _922418 |
||
| 700 |
_aTomita, Takeshi, _eauthor. _922419 |
||
| 856 |
_uhttps://doi.org/10.1002/9783527829712 _zWiley Online Library |
||
| 999 |
_c13886 _d13886 |
||