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020 _a9780199211500
082 _a502.825
_bC42I
100 _aChen, C. J.
_eAuthor
_lEnglish
_92323
245 0 _aIntroduction to Scanning Tunneling Microscopy
_c/ by C. J. Chen.
_h[Electronic Resource]
250 _a2nd Ed.
260 _aNew York
_b: Oxford University Press,
_c2007
520 _aThe scanning tunneling microscope (STM) and the atomic force microscope (AFM), both capable of visualizing and manipulating individual atoms, are the cornerstones of nanoscience and nanotechnology today. The inventors of STM, Gerd Binnig and Heinrich Rohrer, were awarded with the Nobel Prize of physics in 1986. Both microscopes are based on mechanically scanning an atomically sharp tip over a sample surface, with quantum-mechanical tunneling or atomic forces between the tip and the atoms on the sample as the measurable quantities. This book presents the principles of STM and AFM, and the experimental details. Part I presents the principles from a unified point of view: the Bardeen theory of tunneling phenomenon, and the Herring-Landau theory of covalent-bond force. The similarity between those two theories, both rooted from the Heisenberg-Pauling concept of quantum-mechanical resonance, points to the equivalence of tunneling and covalent-bond force. The Tersoff-Hamann model of STM is presented, including the original derivation. The mechanisms of atomic-scale imaging of both STM and AFM are discussed. Part II presents the instrumentation and experimental techniques of STM and AFM, including piezoelectric scanners, vibration isolation, electronics and control, mechanical design, tip treatment and characterization, scanning tunneling spectroscopy, and atomic force detection techniques. Part II ends with illustrative applications of STM and AFM in various fields of research and technology.
650 _aMicroscopy
_915912
650 _aOptical Physics
_92325
650 _aPhysics
_915913
856 _uhttp://dx.doi.org/10.1093/acprof:oso/9780199211500.001.0001
_qPDF
_yClick to Access the Online Book
942 _cEBK
_nYes
999 _c12416
_d12416