000			01633nmm a2200193Ia 4500
008			220920s9999||||xx |||||||||||||| ||und||
020			_a9780511754715
082			_a621.38152 _bF896T
100			_aFreund, L. _eAuthor _lEnglish _92219
245		0	_aThin Film Materials _b: Stress, Defect Formation and Surface Evolution _c/ by L. Freund and S. Suresh. _h[Electronic Resource]
260			_aCambridge _b: Cambridge University Press, _c2004
300			_axviii, 750p.
520			_aThin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.
650			_aEngineering _9406
650			_aFilm Materials _92220
700			_aSuresh, S. _i[Author] _92221
856			_uhttps://doi.org/10.1017/CBO9780511754715 _qPDF _yClick to Access the Online Book
942			_cEBK _nYes
999			_c12383 _d12383