Bias-Stress Stability and Charge-Carrier Trapping in High Performance Organic Thin-Film Transistors by Sibani Bisoyi

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TextPublication details: IIT Jodhpur Electrical Engineering 2015Description: xviii, 107pSubject(s): DDC classification:

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Item type	Home library	Call number	Status	Date due	Barcode	Item holds
Thesis	S. R. Ranganathan Learning Hub	621.381 52 B545B (Browse shelf(Opens below))	Not for loan		TP00003

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