Bias-Stress Stability and Charge-Carrier Trapping in High Performance Organic Thin-Film Transistors by Sibani Bisoyi
Material type:![Text](/opac-tmpl/lib/famfamfam/BK.png)
- 621.381 52 B545B
Item type | Home library | Call number | Status | Date due | Barcode | Item holds |
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S. R. Ranganathan Learning Hub | 621.381 52 B545B (Browse shelf(Opens below)) | Not for loan | TP00003 |
Total holds: 0
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