TY  - BOOK
AU  - Egerton, R.F.
TI  - Physical Principles of Electron Microscopy: An introduction to TEM, SEM, and AEM
SN  - 9783319398761
U1  - 502.825 
PY  - 2006///
CY  - Berlin
PB  - Springer
KW  - Electron Microscopy
KW  - Microscopy
KW  - Materials
KW  - Nanotechnology
KW  - Materials science
ER  -