TY  - BOOK
AU  - Schroder, Dieter K.
TI  - Semiconductor Material and Device Characterization
SN  - 9780471739067
U1  - 621.381 52 
PY  - 2006///
CY  - Hoboken, N.J.
PB  - IEEE Press/ Wiley Interscience
KW  - Semiconductors
KW  - Testing
N1  - Includes bibliographical references and index
UR  - http://www.loc.gov/catdir/enhancements/fy0645/2005048514-d.html
UR  - http://www.loc.gov/catdir/enhancements/fy0645/2005048514-t.html
UR  - http://www.loc.gov/catdir/enhancements/fy0654/2005048514-b.html
ER  -