TY  - DATA
AU  - Watts, John F.,
AU  - Wolstenholme, John,
TI  - An introduction to surface analysis by XPS and AES
SN  - 9781119417644
U1  - 620/.44 23
PY  - 2019///
CY  - Hoboken
PB  - Wiley
KW  - Surfaces (Technology)
KW  - Analysis
KW  - Electron spectroscopy
KW  - Photoelectron spectroscopy
KW  - Auger effect
KW  - fast
N1  - Includes bibliographical references and index
N2  - "The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"--
UR  - https://doi.org/10.1002/9781119417651
ER  -