TY  - DATA
AU  - Freund, L.
AU  - Suresh, S.
TI  - Thin Film Materials: : Stress, Defect Formation and Surface Evolution
SN  - 9780511754715
U1  - 621.38152 
PY  - 2004///
CY  - Cambridge
PB  - : Cambridge University Press
KW  - Engineering
KW  - Film Materials
N2  - Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field
UR  - https://doi.org/10.1017/CBO9780511754715
ER  -