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An Artificial Neural Network Based Framework For Modeling Process Induced Variation in Advanced Devices using BSIM CMG Compact Model by Debasmita Mukherjee

By: Contributor(s): Material type: TextTextPublication details: IIT Jodhpur Department of Electrical Engineering 2022Description: vii;18pSubject(s): DDC classification:
  • 621.381 5 M953A
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