Materials Characterization : Introduction to Microscopic and Spectroscopic Methods / by Yang Leng. [Electronic Resource]
Material type: Computer filePublication details: Weinheim, Germany : Wiley-VCH, 2013Description: 376pISBN:- 9783527334636
- 620.11Â L546M
Item type | Home library | Collection | Call number | Status | Notes | Date due | Barcode | Item holds | |
---|---|---|---|---|---|---|---|---|---|
e-Book | S. R. Ranganathan Learning Hub Online | Textbook | 620.11 L546M (Browse shelf(Opens below)) | Available (e-Book For Access) | Platform : EBSCO | EB0056 |
Browsing S. R. Ranganathan Learning Hub shelves, Shelving location: Online, Collection: Textbook Close shelf browser (Hides shelf browser)
620.1064 K674T Two - Phase Flow : Theory And Applications | 620.110 113 L51C Computational Materials Science : An Introduction | 620.11 G358C Cellular Solids : Structure and Properties | 620.11 L546M Materials Characterization : Introduction to Microscopic and Spectroscopic Methods | 620.110113 T569M Modeling Materials : Continuum, Atomistic and Multiscale Techniques | 620.110286 As34M Materials and the Environment | 620.112 6 F896D Dynamic Fracture Mechanics |
Now in its edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.
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