MARC details
| 000 -LEADER |
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| fixed length control field |
04648nmm a22003375i 4500 |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20230705150622.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
100301s2009 xxu| s |||| 0|eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780387765013 |
| -- |
978-0-387-76501-3 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.112 |
| Edition number |
23 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Williams, David B. |
| 9 (RLIN) |
19619 |
| 245 ## - TITLE STATEMENT |
|---|
| Title |
Transmission Electron Microscopy |
| Medium |
[electronic resource] : |
| Remainder of title |
A Textbook for Materials Science / |
| Statement of responsibility, etc. |
by David B. Williams, C. Barry Carter. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. 2009. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York, NY : |
| Name of publisher, distributor, etc. |
Springer US : |
| -- |
Imprint: Springer, |
| Date of publication, distribution, etc. |
2009. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
CCXLVIII, 820 p. |
| Other physical details |
online resource. |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Basics -- The Transmission Electron Microscope -- Scattering and Diffraction -- Elastic Scattering -- Inelastic Scattering and Beam Damage -- Electron Sources -- Lenses, Apertures, and Resolution -- How to 'See' Electrons -- Pumps and Holders -- The Instrument -- Specimen Preparation -- Diffraction -- Diffraction in TEM -- Thinking in Reciprocal Space -- Diffracted Beams -- Bloch Waves -- Dispersion Surfaces -- Diffraction from Crystals -- Diffraction from Small Volumes -- Obtaining and Indexing Parallel-Beam Diffraction Patterns -- Kikuchi Diffraction -- Obtaining CBED Patterns -- Using Convergent-Beam Techniques -- Imaging -- Amplitude Contrast -- Phase-Contrast Images -- Thickness and Bending Effects -- Planar Defects -- Imaging Strain Fields -- Weak-Beam Dark-Field Microscopy -- High-Resolution TEM -- Other Imaging Techniques -- Image Simulation -- Processing and Quantifying Images -- Spectrometry -- X-ray Spectrometry -- X-ray Spectra and Images -- Qualitative X-ray Analysis and Imaging -- Quantitative X-ray Analysis -- Spatial Resolution and Minimum Detection -- Electron Energy-Loss Spectrometers and Filters -- Low-Loss and No-Loss Spectra and Images -- High Energy-Loss Spectra and Images -- Fine Structure and Finer Details. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
This groundbreaking text has been established as the market leader throughout the world. Now profusely illustrated with full color figures and diagrams throughout the text, Transmission Electron Microscopy: A Textbook for Materials Science, Second Edition, provides the necessary insight and guidance for successful hands-on application of this versatile and powerful materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated. The new edition also includes an extensive collection of questions for the student, providing approximately 800 for self-assessment and over 400 that are suitable for homework assignment. Key Features: Undisputed market leader, now completely revised and updated Ideal for use as a teaching text at the advanced undergraduate and graduate levels and as a hands-on reference for materials scientists Explains why a particular technique should be used and how a specific concept can be put into practice Nearly 700 figures and diagrams, most in full color Praise for the first edition: `The best textbook for this audience available.' - American Scientist "...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!" - Microscopy and Microanalysis `This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.' - Micron `The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.' - MRS Bulletin `The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years....The authors can be proud of an enormous task, very well done.' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Materials-Analysis. |
| 9 (RLIN) |
19620 |
|
|---|
| Topical term or geographic name entry element |
Nanotechnology. |
| 9 (RLIN) |
19621 |
|
|---|
| Topical term or geographic name entry element |
Condensed matter. |
| 9 (RLIN) |
19622 |
|
|---|
| Topical term or geographic name entry element |
Spectrum analysis. |
| 9 (RLIN) |
19623 |
|
|---|
| Topical term or geographic name entry element |
Mechanics, Applied. |
| 9 (RLIN) |
19624 |
|
|---|
| Topical term or geographic name entry element |
Solids. |
| 9 (RLIN) |
19625 |
|
|---|
| Topical term or geographic name entry element |
Characterization and Analytical Technique. |
| 9 (RLIN) |
19626 |
|
|---|
| Topical term or geographic name entry element |
Nanotechnology. |
| 9 (RLIN) |
19621 |
|
|---|
| Topical term or geographic name entry element |
Condensed Matter Physics. |
| 9 (RLIN) |
19627 |
|
|---|
| Topical term or geographic name entry element |
Spectroscopy. |
| 9 (RLIN) |
19628 |
|
|---|
| Topical term or geographic name entry element |
Solid Mechanics. |
| 9 (RLIN) |
19629 |
| 700 ## - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Carter, C. Barry. |
| Relator term |
author. |
| Relationship |
aut |
| -- |
http://id.loc.gov/vocabulary/relators/aut |
| 9 (RLIN) |
19630 |
| 856 ## - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://doi.org/10.1007/978-0-387-76501-3">https://doi.org/10.1007/978-0-387-76501-3</a> |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Koha item type |
e-Book |
