Semiconductor Material and Device Characterization
Schroder, Dieter K.
Semiconductor Material and Device Characterization by Dieter K. Schroder. - 3rd ed. - Hoboken, N.J. IEEE Press/ Wiley Interscience c2006. - xv, 779 p. ill. 25 cm.
Includes bibliographical references and index.
9780471739067
Semiconductors.
Semiconductors--Testing.
621.381 52 / Sc75S
Semiconductor Material and Device Characterization by Dieter K. Schroder. - 3rd ed. - Hoboken, N.J. IEEE Press/ Wiley Interscience c2006. - xv, 779 p. ill. 25 cm.
Includes bibliographical references and index.
9780471739067
Semiconductors.
Semiconductors--Testing.
621.381 52 / Sc75S