Scanning Probe Microscopy Analytical Methods /
Scanning Probe Microscopy Analytical Methods / [electronic resource] :
edited by Roland Wiesendanger.
- 1st ed. 1998.
- Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1998.
- XII, 216 p. 181 illus., 4 illus. in color. online resource.
1. Introduction -- 2. Chemical Information from Scanning Probe Microscopy and Spectroscopy -- 3. Thermovoltages in Scanning Tunneling Microscopy -- 4. Spin-Polarized Scanning Tunneling Microscopy -- 5. Photon Emission from the Scanning Tunneling Microscope -- 6. Laser Scanning Tunneling Microscope -- 7. Scanning Near-Field Optical Microscopy.
This book provides the first comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanisms down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
9783662036068
Nanotechnology.
Surfaces (Technology).
Thin films.
Measurement.
Measuring instruments.
Nanotechnology.
Surfaces, Interfaces and Thin Film.
Measurement Science and Instrumentation.
620.5
1. Introduction -- 2. Chemical Information from Scanning Probe Microscopy and Spectroscopy -- 3. Thermovoltages in Scanning Tunneling Microscopy -- 4. Spin-Polarized Scanning Tunneling Microscopy -- 5. Photon Emission from the Scanning Tunneling Microscope -- 6. Laser Scanning Tunneling Microscope -- 7. Scanning Near-Field Optical Microscopy.
This book provides the first comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of applications of the chemical contrast mechanisms down to the atomic scale in surface physics and chemistry are discussed with extensive references to original work in the recent literature.
9783662036068
Nanotechnology.
Surfaces (Technology).
Thin films.
Measurement.
Measuring instruments.
Nanotechnology.
Surfaces, Interfaces and Thin Film.
Measurement Science and Instrumentation.
620.5